Digital Circuit Experiment Apparatus

I. Product Features (1) Full openness of hardware platform, it not only could complete basic experiments, but also various design experiments, as well as be the platform of innovative experiments or scientific research & development.

(2) It has many common used tools, such as DC power supply, signal source, imported bread board, cymometer, logic pen and so on, which could fully meet requirements of various experiments.

(3) The experiment contents are abundant and close to textbook with reasonable arrangement, which could better enlighten users’ thinking, broaden their mind, and strengthen their understanding to the theoretical knowledge.

II. Performance Parameters (1) Power: Input AC 220V Output +5V (with over-current protection function)

(2) Signal Source: Fixed frequency square wave: 100 KHz, 10 KHz, 1 KHz, 1 Hz Single pulse: positive / negative pulse output

(3) Ten key switches output logic level, ten groups of data indicator lights, adopt double color LED indicates high-low level; two common cathode digital tubes without decoding driver, two common cathode digital tubes with decoding driver

(4) Abundant Component Stock: including two precise potentiometers 1Ω, 1K, 10K, 100K respectively, common used resistance, capacitance, diode, and triode; providing abundant hardware resources for experiments.

(5) Eleven IC Military Sockets: two 8PIN, two 14PIN, two 16PIN, two 20PIN, two 28PIN and one 40PIN, two 28PIN and one 40PIN are self-locking IC sockets.

(6) Common Used Tools: TTL level logic pen, cymometer with measurement range 1Hz~1MHz

(7) One Imported Bread Board (specification 165.1mm× 99.7mm×8.5mm), with transfer of single strand and experiment apparatus plughole

(8) Experiment Apparatus Host Specification: 51cm × 34.5cm× 12cm

III. Experiment Contents Part One Brief Introduction of Experiment Apparatus (1) Operating instruction of digital logic circuit experiment apparatus (2) Basic knowledge of digital circuit experiment

Part Two Basic Experiment (3) Logic function and parameter test experiment of TTL gate circuit (it needs to equip such chips as 74LS00, 74LS04 used for experiment) (4) Decoder and data selector experiment (it needs to equip such chips as 74LS138, 74LS151, 74LS20 used for experiment) (5) Design and test experiment of combinational logic (it needs to equip such chips as 74LS00, 74LS02, 74LS04, 74LS10, 74LS20, 74LS151 used for experiment) (6) Trigger R-S, J-K, T, D experiment (it needs to equip such chips as 74LS47, 74LS02, 74LS10, 74LS74, 74LS112 used for experiment) (7) Digital tube display experiment (it needs to equip such chips as 74LS47, 74LS48, 74LS248, MC14511 used for experiment) (8) Integration counter experiment (it needs to equip such chips as 74LS74, 74LS90, 74LS161, 74LS248 used for experiment) (9) Waveform generation experiment (it needs to equip such chips as 74LS00, 74LS04 used for experiment) (10) 555 timer and its application experiment (it needs to equip chip NE556 used for experiment)

Part Three Optional Experiment (11) Logic function and parameter test experiment of CMOS gate circuit (it needs to equip such chips as CD4011, CD4001, CD4071, CD4070 used for experiment) (12) Test experiment of TTL collector open circuit and three-state output gate (it needs to equip such chips as 74LS00, 74LS03, 74LS04, 74LS10, 74LS125 used for experiment) (13) Connection and driving experiment of integration logic circuit (it needs to equip such chips as 74LS00, 74LS04, CD4001, 74HC00 used for experiment) (14) Adder and digital comparator experiment (it needs to equip such chips as 74LS85, 74LS00, 74LS04, 74LS08, 74LS32, 74LS86 used for experiment) (15) Competition and risk experiment (it needs to equip such chips as 74LS00, 74LS04, 74LS32, 74LS08 used for experiment) (16) Shift register and its application experiment (it needs to equip such chips as 74LS00, 74LS04, 74LS30, 74LS194 used for experiment) (17) Counter and its application experiment (it needs to equip such chips as 74LS00, 74LS10, 74LS04, 74LS32, 74LS192, 74LS248, 74LS47 used for experiment) (18) Pulse distributor and its application experiment (it needs to equip such chips as CC4017, CC4013, CC4027, CC4011, CC4085 used for experiment) (19) Schmidt trigger (it needs to equip such chips as CC4011, CC40106 used for experiment) (20) Mono-stable trigger (it needs to equip such chips as CC4011, HEF4528 used for experiment)